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Two- and three-dimensional vision systems for inspection, control, and metrology : 29-30 October 2003, Providence, Rhode Island, USA /

Bibliographic Details
Corporate Author: Society of Photo-optical Instrumentation Engineers
Other Authors: Batchelor, Bruce G., Hügli, Heinz
Format: Book
Language:English
Published: Bellingham, Washington : SPIE, [2004]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 5265.
Subjects:
Computer vision > Congresses.
Imaging systems > Congresses.
Three-dimensional display systems > Congresses.
Optical pattern recognition systems > Congresses.
Quality control > Optical methods > Congresses.
Optical measurements > Congresses.
Metrology > Congresses.

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Holdings details from Remote Storage
Call Number: TA1634 .T96 2004
 
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TA1634 .T96 2004 Available