Society of Photo-optical Instrumentation Engineers, Batchelor, B. G., & Hügli, H. (2004). Two- and three-dimensional vision systems for inspection, control, and metrology: 29-30 October 2003, Providence, Rhode Island, USA. SPIE.
Chicago Style (17th ed.) CitationSociety of Photo-optical Instrumentation Engineers, Bruce G. Batchelor, and Heinz Hügli. Two- and Three-dimensional Vision Systems for Inspection, Control, and Metrology: 29-30 October 2003, Providence, Rhode Island, USA. Bellingham, Washington: SPIE, 2004.
MLA (9th ed.) CitationSociety of Photo-optical Instrumentation Engineers, et al. Two- and Three-dimensional Vision Systems for Inspection, Control, and Metrology: 29-30 October 2003, Providence, Rhode Island, USA. SPIE, 2004.
Warning: These citations may not always be 100% accurate.