Scanning tunneling microscopy/spectroscopy and related techniques : 12th International Conference STM'03, Eindhoven, The Netherlands, 21-25 July 2003 /

"The plenary and invited presentations can be found in the printed part of the proceedings, whereas the CD contains all the accepted publications"--Pref.

Bibliographic Details

Corporate Authors:	International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques Eindhoven, Netherlands, Technische Universiteit Eindhoven
Other Authors:	Koenraad, P. M. (Paul M.), Kemerink, M. (Martijn)
Format:	Conference Proceeding Book
Language:	English
Published:	Melville, N.Y. : American Institute of Physics, 2003.
Series:	AIP conference proceeedings ; no. 696.
Subjects:	Scanning tunneling microscopy > Congresses. Tunneling spectroscopy > Congresses. Scanning probe microscopy > Congresses. Nanotechnology > Congresses.