Cover Image

Noise and information in nanoelectronics, sensors, and standards : 2-4 June 2003, Santa Fe, New Mexico, USA /

Bibliographic Details
Corporate Authors: Society of Photo-optical Instrumentation Engineers, Texas A & M University. Department of Electrical Engineering. Telecommunications Task Force
Other Authors: Kish, Laszlo B.
Format: Book
Language:English
Published: Bellingham, Washington : SPIE, [2003]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 5115.
Subjects:
Noise > Congresses.
Noise control > Congresses.
Nanotechnology > Congresses.
Information technology > Congresses.
Detectors > Congresses.
Description
Physical Description:xix, 430 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographical references and index.
ISBN:081944975X