Noise and information in nanoelectronics, sensors, and standards : 2-4 June 2003, Santa Fe, New Mexico, USA /

Bibliographic Details
Corporate Authors:	Society of Photo-optical Instrumentation Engineers, Texas A & M University. Department of Electrical Engineering. Telecommunications Task Force
Other Authors:	Kish, Laszlo B.
Format:	Book
Language:	English
Published:	Bellingham, Washington : SPIE, [2003]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 5115.
Subjects:	Noise > Congresses. Noise control > Congresses. Nanotechnology > Congresses. Information technology > Congresses. Detectors > Congresses.

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