Lock-in thermography : basics and use for functional diagnostics of electronic components /
| Main Author: | |
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| Other Authors: | |
| Format: | Book |
| Language: | English |
| Published: |
Berlin ; New York :
Springer,
[2003]
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| Series: | Springer series in advanced microelectronics ;
10. |
| Subjects: |
| Physical Description: | viii, 193 pages : illustrations (some color) ; 24 cm. |
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| Bibliography: | Includes bibliographical references (pages [173]-179) and index. |
| ISBN: | 3540434399 (alk. paper) |