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Lock-in thermography : basics and use for functional diagnostics of electronic components /

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Bibliographic Details
Main Author: Breitenstein, O. (Otwin)
Other Authors: Langenkamp, M. (Martin), 1964-
Format: Book
Language:English
Published: Berlin ; New York : Springer, [2003]
Series:Springer series in advanced microelectronics ; 10.
Subjects:
Electronic apparatus and appliances > Thermal properties.
Electronic apparatus and appliances > Testing.
Semiconductors > Thermal properties.
Thermography.

Evans: Library Stacks

Holdings details from Evans: Library Stacks
Call Number: TK7870.25 .B74 2003
 
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TK7870.25 .B74 2003 Available