Cover Image

Noise in devices and circuits : 2-4 June 2003, Santa Fe, New Mexico, USA /

Bibliographic Details
Corporate Authors: Society of Photo-optical Instrumentation Engineers, National Semiconductor Corporation
Other Authors: Deen, M. Jamal, Çelik-Butler, Zeynep, Levinshtein, Michael E.
Format: Book
Language:English
Published: Bellingham, Washington : SPIE, [2003]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 5113.
Subjects:
Electronic circuits > Noise > Congresses.
Electronic noise > Congresses.
Electric circuits > Noise > Congresses.
Electric noise > Congresses.
Description
Physical Description:xxi, 516 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0819449733