Noise in devices and circuits : 2-4 June 2003, Santa Fe, New Mexico, USA /

Bibliographic Details
Corporate Authors:	Society of Photo-optical Instrumentation Engineers, National Semiconductor Corporation
Other Authors:	Deen, M. Jamal, Çelik-Butler, Zeynep, Levinshtein, Michael E.
Format:	Book
Language:	English
Published:	Bellingham, Washington : SPIE, [2003]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 5113.
Subjects:	Electronic circuits > Noise > Congresses. Electronic noise > Congresses. Electric circuits > Noise > Congresses. Electric noise > Congresses.

Remote Storage