Cover Image

Noise as a tool for studying materials : 2-4 June 2003, Santa Fe, New Mexico, USA /

Bibliographic Details
Corporate Author: Society of Photo-optical Instrumentation Engineers
Other Authors: Weissman, Michael B., Israeloff, Nathan E. (Nathan Eli), 1961-, Kogan, Sh
Format: Book
Language:English
Published: Bellingham, Washington : SPIE, [2003]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 5112.
Subjects:
Random noise theory > Congresses.
Electronic noise > Congresses.
Materials > Testing > Congresses.
Online Access:https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/5012.toc?SSO=1
Description
Physical Description:x, 346 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0819449725