Noise as a tool for studying materials : 2-4 June 2003, Santa Fe, New Mexico, USA /

Bibliographic Details
Corporate Author:	Society of Photo-optical Instrumentation Engineers
Other Authors:	Weissman, Michael B., Israeloff, Nathan E. (Nathan Eli), 1961-, Kogan, Sh
Format:	Book
Language:	English
Published:	Bellingham, Washington : SPIE, [2003]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 5112.
Subjects:	Random noise theory > Congresses. Electronic noise > Congresses. Materials > Testing > Congresses.
Online Access:	https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/5012.toc?SSO=1

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