APA (7th ed.) Citation

National Institute of Standards and Technology (U.S.), Institute of Acoustic Microscopy (U.S.), Society of Photo-optical Instrumentation Engineers, Meyendorf, N., Baaklini, G. Y., & Michel, B. (2003). Testing, reliability, and application of micro- and nano-material systems: 3-5 March, 2003, San Diego, California. SPIE.

Chicago Style (17th ed.) Citation

National Institute of Standards and Technology (U.S.), Institute of Acoustic Microscopy (U.S.), Society of Photo-optical Instrumentation Engineers, Norbert Meyendorf, George Y. Baaklini, and Bernd Michel. Testing, Reliability, and Application of Micro- and Nano-material Systems: 3-5 March, 2003, San Diego, California. Bellingham, Washington: SPIE, 2003.

MLA (9th ed.) Citation

National Institute of Standards and Technology (U.S.), et al. Testing, Reliability, and Application of Micro- and Nano-material Systems: 3-5 March, 2003, San Diego, California. SPIE, 2003.