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Proceedings International Test Conference 2003 : [September 30-October 2, 2003, Charlotte Convention Center, Charlotte, NC, USA /

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Bibliographic Details
Corporate Authors: International Test Conference Charlotte, N.C., IEEE Computer Society. Test Technology Technical Committee, Institute of Electrical and Electronics Engineers. Philadelphia Section
Format: Conference Proceeding Book
Language:English
Published: Washington, D.C. : Piscataway, N.J. : International Test Conference ; IEEE, [2003]
Subjects:
Integrated circuits > Testing > Congresses.
Electronic digital computers > Circuits > Testing > Congresses.
Telecommunication > Congresses.
Radio frequency > Congresses.
Description
Item Description:At head of title: ITC International Test Conference 2003
Conference number inferred.
"IEEE catalog number 03CH37494"--Title page verso.
Physical Description:xvi, 1334 pages : illustrations ; 29 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0780381068