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Proceedings International Test Conference 2003 : [September 30-October 2, 2003, Charlotte Convention Center, Charlotte, NC, USA /

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Bibliographic Details
Corporate Authors: International Test Conference Charlotte, N.C., IEEE Computer Society. Test Technology Technical Committee, Institute of Electrical and Electronics Engineers. Philadelphia Section
Format: Conference Proceeding Book
Language:English
Published: Washington, D.C. : Piscataway, N.J. : International Test Conference ; IEEE, [2003]
Subjects:
Integrated circuits > Testing > Congresses.
Electronic digital computers > Circuits > Testing > Congresses.
Telecommunication > Congresses.
Radio frequency > Congresses.

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Call Number: TK7874 .I593 2003
 
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TK7874 .I593 2003 Available