Speckle metrology 2003 : proceedings : 18-20 June 2003, Trondheim, Norway /

Bibliographic Details
Corporate Authors: SINTEF-gruppen (Norway), Norges teknisk-naturvitenskapelige universitet, Society of Photo-optical Instrumentation Engineers, European Optical Society
Other Authors: Gastinger, Kay, Løkberg, Ole Johan, Winther, Svein
Format: Book
Language:English
Published: Bellingham, Washington : SPIE, [2003]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 4933.
Subjects:
Online Access:https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/4933.toc
Description
Physical Description:ix, 390 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0819447285