Speckle metrology 2003 : proceedings : 18-20 June 2003, Trondheim, Norway /

Bibliographic Details
Corporate Authors: SINTEF-gruppen (Norway), Norges teknisk-naturvitenskapelige universitet, Society of Photo-optical Instrumentation Engineers, European Optical Society
Other Authors: Gastinger, Kay, Løkberg, Ole Johan, Winther, Svein
Format: Book
Language:English
Published: Bellingham, Washington : SPIE, [2003]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 4933.
Subjects:
Online Access:https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/4933.toc

Internet

https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/4933.toc

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Call Number: QC427.8.S64 S63 2003
 
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QC427.8.S64 S63 2003 Available