Cover Image

Optical measurement systems for industrial inspection III : 23-26 June 2003, Munich, Germany /

Bibliographic Details
Corporate Authors: Society of Photo-optical Instrumentation Engineers, European Optical Society, Wissenschaftliche Gesellschaft Lasertechnik
Other Authors: Osten, Wolfgang, Creath, Katherine, Kujawińska, Małgorzata
Format: Book
Language:English
Published: Bellingham, Washington : SPIE, [2003]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 5144.
Subjects:
Quality control > Optical methods > Congresses.
Optical instruments > Industrial applications > Congresses.
Optical detectors > Industrial applications > Congresses.
Online Access:https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/5144.toc
Description
Item Description:"Sponsored ... by SPIE--the International Society for Optical Engineering ; cosponsored by EOS--European Optical Society [and] WLT--Wissenschaftliche Gesellschaft Lasertechnik e.V. (Germany)."
Physical Description:xviii, 896 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0819450146