Optical measurement systems for industrial inspection III : 23-26 June 2003, Munich, Germany /
| Corporate Authors: | , , |
|---|---|
| Other Authors: | , , |
| Format: | Book |
| Language: | English |
| Published: |
Bellingham, Washington :
SPIE,
[2003]
|
| Series: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 5144. |
| Subjects: | |
| Online Access: | https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/5144.toc |
Internet
https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/5144.tocRemote Storage
| Call Number: |
QC367 .O57 2003 |
|
|---|---|---|
| Call Number | Status | Get It |
| QC367 .O57 2003 | Available | |