Machine vision applications in industrial inspection XI : 22-24 January 2003, Santa Clara, California, USA /
| Corporate Authors: | , |
|---|---|
| Other Authors: | , |
| Format: | Book |
| Language: | English |
| Published: |
Bellingham, Washington :
SPIE,
[2003]
|
| Series: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 5011. |
| Subjects: |
| Item Description: | At head of title: Proceedings of Electronic Imaging Science and Technology 2003. |
|---|---|
| Physical Description: | vii, 324 pages : illustrations ; 28 cm. |
| Bibliography: | Includes bibliographical references and index. |
| ISBN: | 0819448117 |