Machine vision applications in industrial inspection XI : 22-24 January 2003, Santa Clara, California, USA /

Bibliographic Details
Corporate Authors:	IS & T--the Society for Imaging Science and Technology, Society of Photo-optical Instrumentation Engineers
Other Authors:	Hunt, Martin A. (Martin Anthony), 1963-, Price, Jeffery R.
Format:	Book
Language:	English
Published:	Bellingham, Washington : SPIE, [2003]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 5011.
Subjects:	Engineering inspection > Automation > Congresses. Computer vision > Industrial applications > Congresses. Quality control > Optical methods > Automation > Congresses. Measurement > Congresses.

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