| Tag |
First Indicator |
Second Indicator |
Subfields |
| LEADER |
00000cam a22000004a 4500 |
| 001 |
in00001765821 |
| 005 |
20151025075836.0 |
| 008 |
030401s2003 maua b 001 0 eng |
| 010 |
|
|
|a 2003050112
|
| 015 |
|
|
|a GBA3-39352
|
| 020 |
|
|
|a 1402073658 (alk. paper)
|
| 035 |
|
|
|a (OCoLC)ocm52001703
|
| 040 |
|
|
|a DLC
|c DLC
|d C#P
|d OHX
|d UKM
|d TXA
|d UtOrBLW
|
| 042 |
|
|
|a pcc
|
| 049 |
|
|
|a TXAM
|
| 050 |
0 |
0 |
|a QC482.D5
|b P43 2003
|
| 072 |
|
7 |
|a QC
|2 lcco
|
| 082 |
0 |
0 |
|a 548/.83
|2 21
|
| 100 |
1 |
|
|a Pecharsky, Vitalij K.
|
| 245 |
1 |
0 |
|a Fundamentals of powder diffraction and structural characterization of materials /
|c by Vitalij K. Pecharsky, Peter Y. Zavalij.
|
| 264 |
|
1 |
|a Boston :
|b Kluwer Academic Publishers,
|c [2003]
|
| 264 |
|
4 |
|c ©2003
|
| 300 |
|
|
|a xxiii, 713 pages :
|b illustrations ;
|c 25 cm. +
|e 1 CD-ROM (4 3/4 in.)
|
| 336 |
|
|
|a text
|b txt
|2 rdacontent
|
| 337 |
|
|
|a unmediated
|b n
|2 rdamedia
|
| 338 |
|
|
|a volume
|b nc
|2 rdacarrier
|
| 538 |
|
|
|a System requirements for disc: PC or Macintosh computers.
|
| 504 |
|
|
|a Includes bibliographical references and index.
|
| 650 |
|
0 |
|a X-rays
|x Diffraction
|x Measurement.
|
| 650 |
|
0 |
|a Powders
|x Optical properties
|x Measurement.
|
| 650 |
|
0 |
|a X-ray crystallography.
|
| 700 |
1 |
|
|a Zavalij, Peter Y.
|
| 938 |
|
|
|a Otto Harrassowitz
|b HARR
|n har035016043
|c 166.00 EUR
|
| 948 |
|
|
|a cataloged
|b cmulkey
|c 2003/7/11
|d 1:50:08 pm
|
| 994 |
|
|
|a E0
|b TXA
|
| 999 |
|
|
|a MARS
|
| 999 |
f |
f |
|s ae76c11d-cd75-3336-ba67-7518ffdcec73
|i 43a68626-73d0-3360-96fb-11ccbed63f8f
|t 0
|
| 952 |
f |
f |
|p normal
|a Texas A&M University
|b College Station
|c Sterling C. Evans Library
|d Evans: Library Stacks
|t 0
|e QC482.D5 P43 2003
|h Library of Congress classification
|i unmediated -- volume
|m A14830387007
|
| 998 |
f |
f |
|a QC482.D5 P43 2003
|t 0
|l Evans: Library Stacks
|