Fundamentals of powder diffraction and structural characterization of materials /

Bibliographic Details
Main Author:	Pecharsky, Vitalij K.
Other Authors:	Zavalij, Peter Y.
Format:	Book
Language:	English
Published:	Boston : Kluwer Academic Publishers, [2003]
Subjects:	X-rays > Diffraction > Measurement. Powders > Optical properties > Measurement. X-ray crystallography.

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