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Fundamentals of powder diffraction and structural characterization of materials /

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Bibliographic Details
Main Author: Pecharsky, Vitalij K.
Other Authors: Zavalij, Peter Y.
Format: Book
Language:English
Published: Boston : Kluwer Academic Publishers, [2003]
Subjects:
X-rays > Diffraction > Measurement.
Powders > Optical properties > Measurement.
X-ray crystallography.
Description
Physical Description:xxiii, 713 pages : illustrations ; 25 cm. + 1 CD-ROM (4 3/4 in.)
Format:System requirements for disc: PC or Macintosh computers.
Bibliography:Includes bibliographical references and index.
ISBN:1402073658 (alk. paper)