Point defects in semiconductors and insulators : determination of atomic and electronic structure from paramagnetic hyperfine interactions /
| Main Author: | |
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| Other Authors: | |
| Format: | Book |
| Language: | English |
| Published: |
Berlin ; New York :
Springer,
[2003]
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| Series: | Springer series in materials science ;
v. 51. |
| Subjects: |
| Physical Description: | xi, 490 pages : illustrations ; 24 cm. |
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| Bibliography: | Includes bibliographical references (pages [467]-484) and index. |
| ISBN: | 3540426957 (alk. paper) |
| ISSN: | 0933-033X ; |