Point defects in semiconductors and insulators : determination of atomic and electronic structure from paramagnetic hyperfine interactions /

Bibliographic Details
Main Author:	Spaeth, Johann-Martin
Other Authors:	Overhof, H. (Harald), 1942-
Format:	Book
Language:	English
Published:	Berlin ; New York : Springer, [2003]
Series:	Springer series in materials science ; v. 51.
Subjects:	Semiconductors > Defects. Semiconductors > Testing > Methodology. Nuclear magnetic resonance spectroscopy.

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