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Nineteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium : SEMI-THERM proceedings 2003 : San Jose, CA, USA, March 11-13, 2003 /

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Bibliographic Details
Corporate Authors: IEEE Semiconductor Thermal Measurement and Management Symposium San Jose, Calif., IEEE Components, Hybrids, and Manufacturing Technology Society
Format: Conference Proceeding Book
Language:English
Published: Piscataway, N.J. : IEEE, [2003]
Subjects:
Semiconductors > Thermal properties > Congresses.
Semiconductors > Cooling > Congresses.
Description
Item Description:Cover title.
"IEEE catalog number 02CH37437"--Title page verso.
Physical Description:[xiv], 404 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographical references.
ISBN:0780377931 (softbound ed.)
078037794X (CD-ROM ed.)