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Nineteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium : SEMI-THERM proceedings 2003 : San Jose, CA, USA, March 11-13, 2003 /

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Bibliographic Details
Corporate Authors: IEEE Semiconductor Thermal Measurement and Management Symposium San Jose, Calif., IEEE Components, Hybrids, and Manufacturing Technology Society
Format: Conference Proceeding Book
Language:English
Published: Piscataway, N.J. : IEEE, [2003]
Subjects:
Semiconductors > Thermal properties > Congresses.
Semiconductors > Cooling > Congresses.

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Call Number: TK7871.85 .I27 2003
 
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TK7871.85 .I27 2003 Available