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Power-constrained testing of VLSI circuits /

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Bibliographic Details
Main Author: Nicolici, Nicola
Other Authors: Al-Hashimi, Bashir
Format: Book
Language:English
Published: Boston : Kluwer Academic Publishers, [2003]
Series:Frontiers in electronic testing ; 22.
Subjects:
Integrated circuits, Very large scale integration > Testing.
Integrated circuits, Very large scale integration > Protection.
Semiconductors > Thermal properties.
Description
Physical Description:xi, 178 pages : illustrations ; 25 cm.
Bibliography:Includes bibliographical references (pages 163-173) and index.
ISBN:140207235X (alk. paper)