Power-constrained testing of VLSI circuits /

Bibliographic Details
Main Author:	Nicolici, Nicola
Other Authors:	Al-Hashimi, Bashir
Format:	Book
Language:	English
Published:	Boston : Kluwer Academic Publishers, [2003]
Series:	Frontiers in electronic testing ; 22.
Subjects:	Integrated circuits, Very large scale integration > Testing. Integrated circuits, Very large scale integration > Protection. Semiconductors > Thermal properties.

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