Computer-aided fault to defect mapping (CAFDM) for defect diagnosis /

Defect diagnosis in random logic is currently done using the stuck-at fault model, while most defects seen in manufacturing result in bridging faults. In this research we use physical design and test failure information combined with bridging and stuck-at fault models to localize defects in random l...

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Bibliographic Details

Main Author:	Stanojevic, Zoran, 1968-
Format:	Thesis Book
Language:	English
Published:	[Place of publication not identified] : [publisher not identified] ; 2002.
Subjects:	Major electrical engineering.
Online Access:	http://proxy.library.tamu.edu/login?url=http://proquest.umi.com/pqdweb?did=764786401&sid=1&Fmt=2&clientId=2945&RQT=309&VName=PQD