Characterizing interfacial structure at non-common-atom heterojunctions with cross-sectional scanning tunneling microscopy /

We show how cross-sectional scanning tunneling microscopy may be used to characterize the structure and composition of the non-common-atom heterojunctions in 6.1 [] semiconductor heterostructures through isovalent impurity discrimination and interface bond identification on the atomic scale. This p...

Full description

Bibliographic Details

Main Author:	Steinshnider, Jeremy David
Format:	Thesis Book
Language:	English
Published:	[Place of publication not identified] : [publisher not identified] ; 2002.
Subjects:	Major physics.
Online Access:	http://proxy.library.tamu.edu/login?url=http://proquest.umi.com/pqdweb?did=726458641&sid=1&Fmt=2&clientId=2945&RQT=309&VName=PQD