Scanning electron microscopy and x-ray microanalysis /
This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning e...
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| Format: | Book |
| Language: | English |
| Published: |
New York :
Kluwer Academic/Plenum Publishers,
[2003]
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| Edition: | 3rd ed. |
| Subjects: | |
| Online Access: | Publisher description |
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