Scanning electron microscopy and x-ray microanalysis /

This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning e...

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Bibliographic Details

Other Authors:	Goldstein, Joseph, 1939-
Format:	Book
Language:	English
Published:	New York : Kluwer Academic/Plenum Publishers, [2003]
Edition:	3rd ed.
Subjects:	Scanning electron microscopy. X-ray microanalysis.
Online Access:	Publisher description