High resolution focused ion beams : FIB and its applications : the physics of liquid metal ion sources and ion optics and their application to focused ion beam technology /

Bibliographic Details
Other Authors: Orloff, Jon, Utlaut, Mark William, 1949-, Swanson, Lynwood, 1934-
Format: Book
Language:English
Published: New York : Kluwer Academic, [2003]
Subjects: