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High resolution focused ion beams : FIB and its applications : the physics of liquid metal ion sources and ion optics and their application to focused ion beam technology /

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Bibliographic Details
Other Authors: Orloff, Jon, Utlaut, Mark William, 1949-, Swanson, Lynwood, 1934-
Format: Book
Language:English
Published: New York : Kluwer Academic, [2003]
Subjects:
Ion bombardment > Industrial applications.

Evans: Library Stacks

Holdings details from Evans: Library Stacks
Call Number: QC702.7.B65 H65 2003
 
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QC702.7.B65 H65 2003 Checked out