An analysis of test effectiveness via surrogate simulation of a commercial IC /
Choosing which test sets to apply to a commercial design is important in order to efficiently achieve low defective part levels. This work compares a test set created by the DO-RE-ME process utilizing the MPG-D defective part level model that maximizes observation at problem sites with a commercial...
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| Format: | Thesis eBook |
| Language: | English |
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[Place of publication not identified] :
[publisher not identified] ;
2001.
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| Online Access: | Link to OAKTrust copy |
| Summary: | Choosing which test sets to apply to a commercial design is important in order to efficiently achieve low defective part levels. This work compares a test set created by the DO-RE-ME process utilizing the MPG-D defective part level model that maximizes observation at problem sites with a commercial automatic test pattern generation test set that utilizes stuck-at faults to generate tests and to estimate defective part level. Incorporated in this comparison are stuck-at fault predictions, MPG-D predictions, and bridging surrogate simulation results. In contrast to standard commercial practice, the MPG-D model also allows analysis on a fault-by-fault basis and on a pattern-by-pattern basis. |
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| Item Description: | "Major subject: Electrical Engineering". Vita. |
| Physical Description: | ix, 37 leaves : illustrations ; 28 cm. Also available online. Issued also on microfiche from Lange Micrographics. |
| Bibliography: | Includes bibliographical references (leaves 34-36). |