An analysis of test effectiveness via surrogate simulation of a commercial IC /

Choosing which test sets to apply to a commercial design is important in order to efficiently achieve low defective part levels. This work compares a test set created by the DO-RE-ME process utilizing the MPG-D defective part level model that maximizes observation at problem sites with a commercial...

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Bibliographic Details

Main Author:	Wicker, Jason David, 1978-
Format:	Thesis eBook
Language:	English
Published:	[Place of publication not identified] : [publisher not identified] ; 2001.
Subjects:	Major electrical engineering.
Online Access:	Link to OAKTrust copy