Materials for infrared detectors II : 8-9 July 2002, Seattle, Washington, USA /

Bibliographic Details
Corporate Author:	Boeing Company
Other Authors:	Longshore, Randolph E., Sivananthan, S. (Siva)
Format:	Book
Language:	English
Published:	Bellingham, Washington : SPIE, [2002]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 4795.
Subjects:	Infrared detectors > Materials > Congresses. Infrared technology > Congresses.

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