Transmission electron microscopy and diffractometry of materials /

Bibliographic Details
Main Author:	Fultz, B. (Brent)
Other Authors:	Howe, James M., 1955-
Format:	Book
Language:	English
Published:	Berlin ; New York : Springer, [2002]
Edition:	2nd ed.
Series:	Physics and astronomy online library
Subjects:	Materials > Microscopy. Transmission electron microscopy. X-ray diffractometer.

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