Cover Image

High performance memory testing : design principles, fault modeling, and self-test /

Show other versions (1)
Bibliographic Details
Main Author: Adams, R. Dean
Format: Book
Language:English
Published: Boston : Kluwer Academic, [2003]
Series:Frontiers in electronic testing.
Subjects:
Semiconductor storage devices > Testing.
Computer storage devices > Testing.
Description
Physical Description:xiii, 246 pages : illustrations ; 25 cm.
Bibliography:Includes bibliographical references (pages [229]-239) and index.
ISBN:1402072554 (alk. paper)