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High performance memory testing : design principles, fault modeling, and self-test /

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Bibliographic Details
Main Author: Adams, R. Dean
Format: Book
Language:English
Published: Boston : Kluwer Academic, [2003]
Series:Frontiers in electronic testing.
Subjects:
Semiconductor storage devices > Testing.
Computer storage devices > Testing.

Remote Storage

Holdings details from Remote Storage
Call Number: TK7895.M4 A27 2003
 
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TK7895.M4 A27 2003 Available