Cover Image

Optical system contamination : effects, measurements, and control VII : 9-11 July 2002, Seattle, USA /

Bibliographic Details
Corporate Authors: Society of Photo-optical Instrumentation Engineers, Boeing Company
Other Authors: Chen, Philip T., Uy, O. Manuel
Format: Book
Language:English
Published: Bellingham, Washington : SPIE, [2002]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 4774.
Subjects:
Space vehicles > Optical equipment > Congresses.
Space vehicles > Contamination > Congresses.
Space environment > Congresses.
Description
Physical Description:vii, 282 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographical references and index.
ISBN:081944541X