Optical system contamination : effects, measurements, and control VII : 9-11 July 2002, Seattle, USA /

Bibliographic Details
Corporate Authors:	Society of Photo-optical Instrumentation Engineers, Boeing Company
Other Authors:	Chen, Philip T., Uy, O. Manuel
Format:	Book
Language:	English
Published:	Bellingham, Washington : SPIE, [2002]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 4774.
Subjects:	Space vehicles > Optical equipment > Congresses. Space vehicles > Contamination > Congresses. Space environment > Congresses.

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