CMOS RF modeling, characterization and applications /

Bibliographic Details
Other Authors:	Deen, M. Jamal, Fjeldly, Tor A.
Format:	Book
Language:	English
Published:	River Edge, N.J. : World Scientific, [2002]
Series:	Selected topics in electronics and systems ; v. 24.
Subjects:	Metal oxide semiconductors, Complementary.

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