Cover Image

Thermal testing of integrated circuits /

Show other versions (1)
Bibliographic Details
Main Author: Altet, Josep
Other Authors: Rubio, Antonio, 1954-
Format: Book
Language:English
Published: Boston : Kluwer Academic Publishers, [2002]
Subjects:
Integrated circuits > Testing.
Integrated circuits > Thermal properties.
Temperature measurements.
Search Result 1
Cover Image
by Altet, Josep
Published 2002
Connect to the full text of this electronic book
eBook
Show all versions (2)