Cover Image

Thermal testing of integrated circuits /

Show other versions (1)
Bibliographic Details
Main Author: Altet, Josep
Other Authors: Rubio, Antonio, 1954-
Format: Book
Language:English
Published: Boston : Kluwer Academic Publishers, [2002]
Subjects:
Integrated circuits > Testing.
Integrated circuits > Thermal properties.
Temperature measurements.

Remote Storage

Holdings details from Remote Storage
Call Number: TK7874 .A44 2002
 
Call Number Status Get It
TK7874 .A44 2002 Available