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Thermal testing of integrated circuits /

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Bibliographic Details
Main Author: Altet, Josep
Other Authors: Rubio, Antonio, 1954-
Format: Book
Language:English
Published: Boston : Kluwer Academic Publishers, [2002]
Subjects:
Integrated circuits > Testing.
Integrated circuits > Thermal properties.
Temperature measurements.
Description
Physical Description:xiv, 204 pages : illustrations ; 25 cm.
Bibliography:Includes bibliographical references and index.
ISBN:1402070764 (alk. paper)