Altet, J., & Rubio, A. (2002). Thermal testing of integrated circuits. Kluwer Academic Publishers.
Chicago Style (17th ed.) CitationAltet, Josep, and Antonio Rubio. Thermal Testing of Integrated Circuits. Boston: Kluwer Academic Publishers, 2002.
MLA (9th ed.) CitationAltet, Josep, and Antonio Rubio. Thermal Testing of Integrated Circuits. Kluwer Academic Publishers, 2002.
Warning: These citations may not always be 100% accurate.