Society of Photo-optical Instrumentation Engineers, Meyendorf, N., Baaklini, G. Y., & Michel, B. (2002). Nondestructive evaluation and reliability of micro- and nanomaterial systems: 18-19 March 2002, Newport Beach, USA. SPIE.
Chicago Style (17th ed.) CitationSociety of Photo-optical Instrumentation Engineers, Norbert Meyendorf, George Y. Baaklini, and Bernd Michel. Nondestructive Evaluation and Reliability of Micro- and Nanomaterial Systems: 18-19 March 2002, Newport Beach, USA. Bellingham, Washington: SPIE, 2002.
MLA (9th ed.) CitationSociety of Photo-optical Instrumentation Engineers, et al. Nondestructive Evaluation and Reliability of Micro- and Nanomaterial Systems: 18-19 March 2002, Newport Beach, USA. SPIE, 2002.
Warning: These citations may not always be 100% accurate.