Application of polyatomic primary ions for organic secondary ion mass spectrometry /

Secondary ion mass spectrometry (SIMS) is a surface analytical technique capable of providing elemental, chemical, and spatial information about a surface. When equipped with a time-of-flight (TOF) mass analyzer, the surface sensitivity of the technique (TOF-SIMS) is maximized. The chief limitatio...

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Bibliographic Details

Main Author:	Diehnelt, Christopher Wayne, 1974-
Format:	Thesis Book
Language:	English
Published:	[Place of publication not identified] : [publisher not identified] ; 2001.
Subjects:	Major chemistry.
Online Access:	http://proxy.library.tamu.edu/login?url=http://proquest.umi.com/pqdweb?did=726104161&sid=1&Fmt=2&clientId=2945&RQT=309&VName=PQD